X-ray Raman scattering

X-ray Raman scattering (XRS) is a spectroscopy technique that combines elements of X-ray scattering and Raman scattering to study the electronic and structural properties of materials at the atomic scale. It involves the inelastic scattering of X-ray photons from the electrons in a sample, where the energy of the incident X-ray photons is partially transferred to the electronic states of the material. This results in a change in the energy and momentum of the scattered X-rays.