Resonant inelastic X-ray scattering

Resonant Inelastic X-ray Scattering (RIXS) is an advanced spectroscopic technique used primarily in the study of the electronic and magnetic properties of materials. It combines elements of X-ray scattering and spectroscopy to provide insights into the excitations of a system, such as phonons, magnons, and electronic excitations, often with a high level of energy resolution.