Tip-enhanced Raman spectroscopy

Tip-enhanced Raman spectroscopy (TERS) is a powerful analytical technique that combines the principles of Raman spectroscopy with scanning probe microscopy (SPM), often utilizing a scanning tunneling microscope (STM) or atomic force microscope (AFM). This technique enables the study of materials at the nanoscale, providing enhanced spatial resolution and sensitivity compared to conventional Raman spectroscopy.