George Edward Alcorn Jr. is an American physicist and inventor known for his contributions to the field of physics and engineering, particularly in the area of X-ray imaging and semiconductor technology. He was born on October 22, 1940, in Calvert, Texas. Alcorn is well-known for inventing the imaging X-ray spectrometer, which is a device used for analyzing X-rays from materials. His work has applications in various fields, including materials science and medicine.
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